AI-Enabled In-Situ Quality Control: Learning Beyond the Known

Abstract: Modern manufacturing generates increasingly rich in-situ sensing data, creating new opportunities for AI to enable automated and intelligent quality control decisions. However, conventional quality control using supervised learning relies on abundant labeled data and assumes that future product defects or process faults resemble those known during training. In practice, new defect types emerge, while abnormal conditions may be rarely observed or completely unknown. These challenges are particularly important for in-situ quality control, where defects must be detected or correctly classified for real-time decision-making, including newly emerging defects with limited or unavailable labels. Moreover, for latent defects that cannot be directly inspected online, defects must instead be predicted from indirect process-sensing signals. This requires mapping process-signal changes to possible defects despite scarce or unavailable defect training samples. This talk explores how advances in AI can address these challenges and enable more adaptive and intelligent in-situ quality control and decision-making for smart manufacturing.
 

Bio: Dr. Judy Jin is the A. Galip Ulsoy Collegiate Professor of Engineering and Professor of Industrial and Operations Engineering at the University of Michigan. Her research lies at the intersection of data science and quality engineering, with a focus on synergistically integrating engineering models, AI, and advanced quality control methods to improve system design and operational performance. She has served as PI/Co-PI on more than $20 million in federally and industry-funded research. Her work has received numerous honors, including 18 Best Paper Awards, the S.M. Wu Research Implementation Award from SME, the Forging Achievement Award from FIERF, the NSF CAREER Award, and the NSF PECASE Award.

Dr. Jin currently serves as Editor-in-Chief of IISE Transactions. She has also served as Vice President of INFORMS, Chair of the INFORMS Quality, Statistics and Reliability Section, and President of the IISE Quality Control and Reliability Engineering Division. She is a Fellow of ASME, IISE, and INFORMS.